AFM-Bruker – Dimension Icon

AFM-Bruker – Dimension Icon

The AFM Bruker Dimension Icon is the newest development of Bruker’s nanoscale imaging and characterization technologies.

The Dimension Icon uses a large sample tip-scanning AFM platform and includes sensors that compensate for temperature and noise rendering levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.  

View the AFM-Bruker – Dimension Icon Brochure (PDF version, 1,326 KB)

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