AFM Park NX10

AFM Park NX10

The AFM Park NX10 is an Accurate Atomic Force Microscope for Nanotechnology.

This tools' material characterization techniques include:

  • non-Contact AFM
  • Contact AFM
  • Lateral Force Microscopy (LFM)
  • Phase Imaging
  • Intermittent Tapping
  • Conductive AFM
  • I-V Spectroscopy 
  • Scanning Kelvin Probe Microscopy (SKPM)
  • Electrostatis Force Microscopy (EFM) including Dynamic Contact (DC-EFM) and Piezoresponse Force Microscopy (PFM)


Download the AFM Park NX10 Brochure (PDF version, 1,242 KB)

Back to top