AFM Park NX10

The AFM Park NX10 is an Accurate Atomic Force Microscope for Nanotechnology.

This tools' material characterization techniques include:

• non-Contact AFM
• Contact AFM
• Lateral Force Microscopy (LFM)
• Phase Imaging
• Intermittent Tapping
• Conductive AFM
• I-V Spectroscopy 
• Scanning Kelvin Probe Microscopy (SKPM)
• Electrostatis Force Microscopy (EFM) including Dynamic Contact (DC-EFM) and Piezoresponse Force Microscopy (PFM)

Download the AFM Park NX10 Brochure (PDF version, 1,242 KB)