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AFM Park NX10

The AFM Park NX10 is an Accurate Atomic Force Microscope for Nanotechnology.

This tools' material characterization techniques include:

non-Contact AFM
Contact AFM
Lateral Force Microscopy (LFM)
Phase Imaging
Intermittent Tapping
Conductive AFM
I-V Spectroscopy
Scanning Kelvin Probe Microscopy (SKPM)
Electrostatis Force Microscopy (EFM) including Dynamic Contact (DC-EFM) and Piezoresponse Force Microscopy (PFM)