
AFM Park NX10
The AFM Park NX10 is an Accurate Atomic Force Microscope for Nanotechnology.
This tools' material characterization techniques include:
- non-Contact AFM
- Contact AFM
- Lateral Force Microscopy (LFM)
- Phase Imaging
- Intermittent Tapping
- Conductive AFM
- I-V Spectroscopy
- Scanning Kelvin Probe Microscopy (SKPM)
- Electrostatis Force Microscopy (EFM) including Dynamic Contact (DC-EFM) and Piezoresponse Force Microscopy (PFM)
Download the AFM Park NX10 Brochure (PDF version, 1,242 KB)