Ellipsometer – Horiba UVISEL FUV-NIR

The UVISEL Scanning Spectroscopic Ellipsometer covers a range from FUV to NIR (255 - 2100 nanometers in wavelength) for thin film characterizations.

Including thin to thick layers, with or without a transparent substrate, in the fields of semiconductors, flat panel displays, optoelectronics, photovoltaics, and optical and functional coatings.

View the Ellipsometer – Horiba UVISEL FUV-NIR Brochure (PDF version, 2,014 KB)