The Dektak is a profilometer used for measuring step heights or trench depths on a surface. The display range of the data is 200 A to 655,000 A (65.5 um) with a vertical resolution of ~ 5 A.
This stylus surface profiler provides repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analysis.
There are several methods of application, such as surface roughness verification, thin film inspection, solar trace analysis, and microfluids.
Download the Profiler – DektakXT Brochure (PDF version, 2,070 KB)